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Abstract
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For the Burr-Type X distributed lifetimes, optimal accelerated life test plans are determined under the assumptions of periodic inspection and Type I censoring. Computational results indicate that for the range of param eter values considered the asymptotic variance of the estimated mean or pth quantile at the use stress is not sensitive to the number of inspections at over stress levels. Senstivity analyses are also conducted to see how sensitive the asymptotic variance of the estimated mean is with respect to the uncertainties involved in the guessed failure probabilities at the use and high stress levels.
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